37‐3: Study on the Influence of Scan Time on the Test Accuracy of High‐ppi Fast LCD Product Response Time
This paper investigates the impact of scan time for high PPILCD products on the test response time. By reducing the scan time per row, shortening the working distance of the probe, optimizing the test images and other methods, the scanning time in the test area is decreased, thus reducing its influence on the test response time
Institutions
- BOE Technology Group (China) (CN)
Publication Details
- Journal
- SID Symposium Digest of Technical Papers
- Published
- 2025-06-01
- DOI
- https://doi.org/10.1002/sdtp.18202
- Citations
- 1
- Primary Topic
- Prenatal Screening and Diagnostics
- Type
- article
- Field-Weighted Citation Impact
- 3.49