P‐84: The Causes and Improvement of Lens Damage in Micro‐OLED Display

In order to improve the light output efficiency of the device in Micro‐OLED, micro‐lens (Lens) are usually configured on the pixels. This paper investigates the lens damage in Micro‐OLED 4k product. We found that the cause of lens damage was insufficient evaporation of the photoresist (RP) solvent due to the low baking temperature of the Bonding Pad Open (PDO) mask, which resulted in pit‐like defects after development and lens damage during PDO etching. Ultimately, by removing the Post‐Exposure Baking(PEB) process, we reduced Lens damage to 0%.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18546
Primary Topic
Prenatal Screening and Diagnostics
Type
article
Field-Weighted Citation Impact
0.00
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article

P‐84: The Causes and Improvement of Lens Damage in Micro‐OLED Display

SID Symposium Digest of Technical Papers
Prenatal Screening and Diagnostics
article

P‐84: The Causes and Improvement of Lens Damage in Micro‐OLED Display

article en

Abstract

In order to improve the light output efficiency of the device in Micro‐OLED, micro‐lens (Lens) are usually configured on the pixels. This paper investigates the lens damage in Micro‐OLED 4k product. We found that the cause of lens damage was insufficient evaporation of the photoresist (RP) solvent due to the low baking temperature of the Bonding Pad Open (PDO) mask, which resulted in pit‐like defects after development and lens damage during PDO etching. Ultimately, by removing the Post‐Exposure Baking(PEB) process, we reduced Lens damage to 0%.

SID Symposium Digest of Technical PapersVol. 56(1)
BOE Technology Group (China) (CN)
Affordable and clean energy
Openalex Percentile: Top 33%
Prenatal Screening and Diagnostics
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P‐84: The Causes and Improvement of Lens Damage in Micro‐OLED Display · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS