P‐126: Direct X‐Ray Detecting Gap‐Type Thin‐Film Transistors for Ultra‐High Spatial Resolution Flat‐Panel Image Receptors
In this paper, we propose to use Gap‐type TFT to implement the direct X‐ray detection for ultra‐high spatial resolution receptors, which are even suitable for the flexible CT applications. The device test‐key is fabricated and measured to show that the X‐ray photocurrent of Gap‐type TFT is approximate 10 nA large. The preliminary pixel estimation of the direct‐readout and passive pixel sensor are presented. This work proves that Gap‐type TFT is an extraordinary candidate for the ultra‐high spatial resolution direct X‐ray detecting system.
Institutions
- National Yang Ming Chiao Tung University (TW)
- University of Waterloo (CA)
Publication Details
- Journal
- SID Symposium Digest of Technical Papers
- Published
- 2025-06-01
- DOI
- https://doi.org/10.1002/sdtp.18589
- Primary Topic
- Geochemistry and Geologic Mapping
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- University of Waterloo
- Waterloo Institute for Nanotechnology, University of Waterloo