P‐254: <i>Late‐News Poster:</i> A Novel Analytical Method of Charge Injection and Emission Behaviors in Tandem Organic Light Emitting Diode

We propose a novel analytical method of charge injection and emission in tandem organic light emitting diode (OLED) using displacement current and current density‐voltage‐luminance (DC‐JVL) measurement. We found that the current and emission in the low‐voltage regions of the tandem OLEDs are good indicators of the reliability of the tandem OLED.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18699
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

P‐254: Late‐News Poster: A Novel Analytical Method of Charge Injection and Emission Behaviors in Tandem Organic Light Emitting Diode

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

P‐254: Late‐News Poster: A Novel Analytical Method of Charge Injection and Emission Behaviors in Tandem Organic Light Emitting Diode

article en

Abstract

We propose a novel analytical method of charge injection and emission in tandem organic light emitting diode (OLED) using displacement current and current density‐voltage‐luminance (DC‐JVL) measurement. We found that the current and emission in the low‐voltage regions of the tandem OLEDs are good indicators of the reliability of the tandem OLED.

SID Symposium Digest of Technical PapersVol. 56(1)
Japan Advanced Institute of Science and Technology (JP), Northwestern Polytechnic University (US)
Affordable and clean energy
Openalex Percentile: Top 69%
Geochemistry and Geologic Mapping
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P‐254: <i>Late‐News Poster:</i> A Novel Analytical Method of Charge Injection and Emission Behaviors in Tandem Organic Light Emitting Diode · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS