5‐1: <i>Invited Paper:</i> Progress and Challenges of QD‐EL Technology

Quantum‐dot light‐emitting diodes (QLEDs) have emerged as revolutionary candidates for advanced display systems, demonstrating exceptional electroluminescent performance across the visible spectrum. While current developments have achieved near‐industrialization benchmarks in efficiency and operational stability for RGB emissive devices, critical commercialization prerequisites—particularly batch‐to‐batch consistency and long‐term reliability metrics—remain critically underinvestigated. This work systematically decouples the fundamental origins of performance variability in QLED architectures through interfacial engineering analysis. We demonstrate that controlled surface passivation of zinc oxide electron transport layers (ZnO ETLs) effectively suppresses both temporal and spatial performance fluctuations. These interfacial stabilization strategies establish a universal framework for resolving the principal consistency‐reliability trade‐off that currently impedes QLED technology transition from laboratory‐scale achievements to industrial manufacturability.