99‐4: Dynamic X‐ray Flat Panel Detector with High Imaging Quality Based on Amorphous Silicon PIN Photodiode

X‐ray flat panel detectors based on TFT are widely used in the fields of medical digital imaging and industrial inspection. This paper is based on the a‐Si TFT+PIN detection panels. Dynamic detection is achieved by high thickness PIN, and low noise is realized simultaneously. On this basis, we start from the principle of lag generation and design new pixel structure and process. Ultimately, dynamic detection with low lag is achieved.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18445
Primary Topic
Geochemistry and Geologic Mapping
Type
article
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article

99‐4: Dynamic X‐ray Flat Panel Detector with High Imaging Quality Based on Amorphous Silicon PIN Photodiode

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

99‐4: Dynamic X‐ray Flat Panel Detector with High Imaging Quality Based on Amorphous Silicon PIN Photodiode

article en

Abstract

X‐ray flat panel detectors based on TFT are widely used in the fields of medical digital imaging and industrial inspection. This paper is based on the a‐Si TFT+PIN detection panels. Dynamic detection is achieved by high thickness PIN, and low noise is realized simultaneously. On this basis, we start from the principle of lag generation and design new pixel structure and process. Ultimately, dynamic detection with low lag is achieved.

SID Symposium Digest of Technical PapersVol. 56(1)
BOE Technology Group (China) (CN)
Industry, innovation and infrastructure
Openalex Percentile: Top 70%
Geochemistry and Geologic Mapping
DOISourceOpenAlex
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99‐4: Dynamic X‐ray Flat Panel Detector with High Imaging Quality Based on Amorphous Silicon PIN Photodiode · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS