P‐201: <i>Distinguished Poster:</i> Degradation Analysis of Organic Charge‐Generation Layer by Impedance Spectroscopy

Understanding the degradation mechanisms of the charge generation layer (CGL) is critical for developing stable tandem organic light‐emitting diodes (OLEDs). Capacitance‐voltage measurements and modulus spectroscopy revealed that dopant diffusion at the CGL interface increases driving voltage. Equivalent circuit modeling confirmed resistance/capacitance shifts, guiding CGL optimization for enhanced stability.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18681
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

P‐201: Distinguished Poster: Degradation Analysis of Organic Charge‐Generation Layer by Impedance Spectroscopy

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

P‐201: Distinguished Poster: Degradation Analysis of Organic Charge‐Generation Layer by Impedance Spectroscopy

article en

Abstract

Understanding the degradation mechanisms of the charge generation layer (CGL) is critical for developing stable tandem organic light‐emitting diodes (OLEDs). Capacitance‐voltage measurements and modulus spectroscopy revealed that dopant diffusion at the CGL interface increases driving voltage. Equivalent circuit modeling confirmed resistance/capacitance shifts, guiding CGL optimization for enhanced stability.

SID Symposium Digest of Technical PapersVol. 56(1)
Tianma Microelectronics (China) (CN)
Openalex Percentile: Top 70%
Geochemistry and Geologic Mapping
DOIOpen Access PDFOpenAlex
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P‐201: <i>Distinguished Poster:</i> Degradation Analysis of Organic Charge‐Generation Layer by Impedance Spectroscopy · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS