P‐179: Verification and Elimination of LCD Color Deviation Caused by Thickness Fluctuation of Gate Insulator Layer

We verified thickness fluctuation of gate insulator is the main cause of red/green color deviation observed n LCD white screen. The evidence is GI thickness and chromatic coordinates show a oscillating relation which reflect the interference effect. We also show that the color deviation can be eliminated by a color demura scheme.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18655
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

P‐179: Verification and Elimination of LCD Color Deviation Caused by Thickness Fluctuation of Gate Insulator Layer

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

P‐179: Verification and Elimination of LCD Color Deviation Caused by Thickness Fluctuation of Gate Insulator Layer

article en

Abstract

We verified thickness fluctuation of gate insulator is the main cause of red/green color deviation observed n LCD white screen. The evidence is GI thickness and chromatic coordinates show a oscillating relation which reflect the interference effect. We also show that the color deviation can be eliminated by a color demura scheme.

SID Symposium Digest of Technical PapersVol. 56(1)
San’an Optoelectronics (China) (CN)
Openalex Percentile: Top 70%
Geochemistry and Geologic Mapping
DOIOpen Access PDFOpenAlex
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P‐179: Verification and Elimination of LCD Color Deviation Caused by Thickness Fluctuation of Gate Insulator Layer · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS