7‐4: a‐IGZO TFT‐Based Selective Scan Driver with Stable Operation in Depletion Mode

Increasing refresh rates and resolution elevate the operational frequency of scan drivers, leading to higher power consumption. The variable refresh rate (VRR) technique dynamically adjusts the refresh rate to reduce power consumption. However, VRR control the refresh rate for the entire area uniformly, which limits the potential to optimize power consumption. To address this limitation, an amorphous indium‐gallium‐zinc‐oxide thin‐film transistor (a‐IGZO TFT)‐based selective driving circuit was presented. This circuit reduces power consumption by allowing only selected areas to operate at a higher refresh rate. However, the proposed circuit cannot operate in depletion mode. This study proposes a selective driving circuit that supports selective driving while operating stably in both depletion and enhancement modes. Simulation results confirm the robustness of the proposed circuit against threshold voltage variations. This advancement can be applied to smartphone and virtual reality displays, enhancing power efficiency and delivering a high‐quality user experience.