61‐3: Failure Analysis in Dry Roll‐Transferred Micro‐LEDs with Limited Prior Knowledge

This study analyzes micro‐LEDs using focused ion beam milling and X‐ray spectroscopy. Composed of GaN with six layers (39 × 44 μm²), defects like Kirkendall voids and misalignment cause failures. A 3D model was developed to aid future failure analysis, addressing high transfer costs in micro‐LED displays.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18295
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

61‐3: Failure Analysis in Dry Roll‐Transferred Micro‐LEDs with Limited Prior Knowledge

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

61‐3: Failure Analysis in Dry Roll‐Transferred Micro‐LEDs with Limited Prior Knowledge

article en

Abstract

This study analyzes micro‐LEDs using focused ion beam milling and X‐ray spectroscopy. Composed of GaN with six layers (39 × 44 μm²), defects like Kirkendall voids and misalignment cause failures. A 3D model was developed to aid future failure analysis, addressing high transfer costs in micro‐LED displays.

SID Symposium Digest of Technical PapersVol. 56(1)
Kumoh National Institute of Technology (KR), Korea Institute of Machinery & Materials (KR)
Openalex Percentile: Top 70%
Geochemistry and Geologic Mapping
DOISourceOpenAlex
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61‐3: Failure Analysis in Dry Roll‐Transferred Micro‐LEDs with Limited Prior Knowledge · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS