P‐124: Characterization of Electrical Crosstalk in PbS Quantum Dot CMOS Image Sensors for Ultra‐High‐Resolution Imaging

The electrical crosstalk of QD‐based CMOS image sensors is studied in this work. We modified existing crosstalk models to suit QD‐CIS systems and designed specialized electrode patterns to analyze electrical crosstalk in multi‐pixel QD photodiode devices, refining predictions and improving sensor architecture for high‐ quality imaging applications.