P‐16: CMOS‐Type Scan Driver Circuit Based on LTPO TFTs

We proposed a CMOS‐type scan driver circuit using LTPO TFTs. The core logic part is designed as CMOS logic gates using LTPO TFTs, while the output part is composed of LTPS TFTs only to optimize the design area. In addition, double‐gate structural Oxide TFTs are used to prevent operation in depletion mode. We confirmed that the output signal is stable through the fabricated circuit.