P‐210: Integrated Multilayer Analysis Platform for OLED Evaporation and Encapsulation Based on TOFSIMS

TOF‐SIMS can expand the range of detectable scenarios and enhance detection capabilities, enabling the construction of a comprehensive detection platform that integrates the entire EVEN process. Specifically, it focuses on the detection of light extraction structures and BPDL.

Institutions

BOE Technology Group (China) (CN)

Publication Details

Journal: SID Symposium Digest of Technical Papers
Published: 2025-06-01
DOI: https://doi.org/10.1002/sdtp.18690
Primary Topic: Geochemistry and Geologic Mapping
Type: article
Field-Weighted Citation Impact: 0.00

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article

P‐210: Integrated Multilayer Analysis Platform for OLED Evaporation and Encapsulation Based on TOFSIMS

Jun 1, 2025

SID Symposium Digest of Technical Papers

Geochemistry and Geologic Mapping

article

P‐210: Integrated Multilayer Analysis Platform for OLED Evaporation and Encapsulation Based on TOFSIMS

June 1, 2025article en

Abstract

SID Symposium Digest of Technical PapersVol. 56(1)

BOE Technology Group (China) (CN)

Openalex Percentile: Top 70%

Geochemistry and Geologic Mapping

DOI Open Access PDF OpenAlex

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P‐210: Integrated Multilayer Analysis Platform for OLED Evaporation and Encapsulation Based on TOFSIMS · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS