P‐91: Multi‐Reference Imaging Light Measurement Device

Emerging display technologies, such as OLEDonSi displays, present both new opportunities and challenges in display metrology. To achieve accurate color measurements for displays with spatially inhomogeneous spectral emissions, we propose a novel measurement concept. This concept aims to quickly and precisely measure the angular properties of a display. Our solution is an imaging system equipped with a conoscopic lens, offering a wide field of view and multiple spectral reference spots to correct for spectral variations. All spectral reference spots are recorded in parallel by separate spectroradiometer. By combining camera images with spectral data, we effectively characterize the angular color properties of the display.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18555
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

P‐91: Multi‐Reference Imaging Light Measurement Device

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

P‐91: Multi‐Reference Imaging Light Measurement Device

article en

Abstract

Emerging display technologies, such as OLEDonSi displays, present both new opportunities and challenges in display metrology. To achieve accurate color measurements for displays with spatially inhomogeneous spectral emissions, we propose a novel measurement concept. This concept aims to quickly and precisely measure the angular properties of a display. Our solution is an imaging system equipped with a conoscopic lens, offering a wide field of view and multiple spectral reference spots to correct for spectral variations. All spectral reference spots are recorded in parallel by separate spectroradiometer. By combining camera images with spectral data, we effectively characterize the angular color properties of the display.

SID Symposium Digest of Technical PapersVol. 56(1)
Analytical Instrument Systems (United States) (US)
Openalex Percentile: Top 70%
Geochemistry and Geologic Mapping
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