61‐4: Improvement of Horizontal Line Defects in MicroLED Displays

Horizontal lines were discovered during the reliability test of micro‐LED display. The basic reason is the short of metal lines with different voltages owing to edge design and film structure. By optimizing process flow and backplane design, the defect is significantly improved. Furthermore, several suggestions of design have been proposed.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18296
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
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article

61‐4: Improvement of Horizontal Line Defects in MicroLED Displays

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

61‐4: Improvement of Horizontal Line Defects in MicroLED Displays

article en

Abstract

Horizontal lines were discovered during the reliability test of micro‐LED display. The basic reason is the short of metal lines with different voltages owing to edge design and film structure. By optimizing process flow and backplane design, the defect is significantly improved. Furthermore, several suggestions of design have been proposed.

SID Symposium Digest of Technical PapersVol. 56(1)
San’an Optoelectronics (China) (CN)
Openalex Percentile: Top 71%
Geochemistry and Geologic Mapping
DOISourceOpenAlex
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61‐4: Improvement of Horizontal Line Defects in MicroLED Displays · SID Symposium Digest of Technical Papers (2025) | TGRS Research Map | TGRS