P‐75: Adaptive Optics De‐Mura Technology for OLED Displays

This paper introduces the two main types of Mura currently existing in OLED displays: uneven display and vertical Mura, and their optical‐electrical characteristics. Based on the existing implementation of optical De‐Mura and the limitations of Mura compensation, a quantitative feature extraction model for these two types of Mura is established, and the result of feature recognition is used to adaptively select more suitable optical De‐Mura photography, data processing, and compensation IP configuration, which effectively improves the compensation ability of optical De‐Mura and production yield. With these approaches, this research will probably spread a significant reference value for optical De‐Mura of OLED and other display technologies.

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Publication Details

Journal
SID Symposium Digest of Technical Papers
Published
2025-06-01
DOI
https://doi.org/10.1002/sdtp.18538
Primary Topic
Geochemistry and Geologic Mapping
Type
article
Field-Weighted Citation Impact
0.00
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article

P‐75: Adaptive Optics De‐Mura Technology for OLED Displays

SID Symposium Digest of Technical Papers
Geochemistry and Geologic Mapping
article

P‐75: Adaptive Optics De‐Mura Technology for OLED Displays

article en

Abstract

This paper introduces the two main types of Mura currently existing in OLED displays: uneven display and vertical Mura, and their optical‐electrical characteristics. Based on the existing implementation of optical De‐Mura and the limitations of Mura compensation, a quantitative feature extraction model for these two types of Mura is established, and the result of feature recognition is used to adaptively select more suitable optical De‐Mura photography, data processing, and compensation IP configuration, which effectively improves the compensation ability of optical De‐Mura and production yield. With these approaches, this research will probably spread a significant reference value for optical De‐Mura of OLED and other display technologies.

SID Symposium Digest of Technical PapersVol. 56(1)
Tianma Microelectronics (China) (CN), Xiamen University of Technology (CN)
Openalex Percentile: Top 71%
Geochemistry and Geologic Mapping
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