P‐190: Reliable Simulation and Prediction of Water Vapor Transmission Rate in High‐Performance Thin‐Film Encapsulation

The water vapor barrier capability of the TFE layer is crucial for ensuring the performance and lifetime of OLED devices. WVTR testing typically takes long time, hence using simulation methods to predict the water vapor permeation behavior of OLED devices is a reasonable choice. In this study, we have established a water vapor permeation simulation model based on Fick's law, which can be used to predict the WVTR values of TFE inorganic films and the water vapor concentration at any time or position within the boundary conditions. The simulation model demonstrated high accuracy in predicting the water vapor barrier behavior of TFE films, with simulation results closely matching the experimental results. Finally, we applied the simulation model to assess the water vapor barrier capability of TFE layers corresponding to different isolation column structures in OLED devices, which can be effectively applied to the assessment and prediction of OLED encapsulation materials and structures.