Methods for increasing powertrain test bench utilization

Background: Test bench utilization is a critical performance factor in R&D environments where physical resources are constrained, and efficient workflows are essential. Despite significant technical advances, many test benches still suffer downtime not only from equipment failures but also from operational inefficiencies. Purpose: The purpose of this thesis is to investigate the causes of downtime on an electric powertrain test bench and evaluate management methods to increase its utilization. Methods: A single‐case study of an electric powertrain test bench was conducted using three complementary data‐collection approaches. First, logbook data was analysed to quantify usage patterns and downtime events. Second, semi‐structured interviews with operators and planners provided insight into procedural and organizational bottlenecks. Third, direct observations of test‐bench operations were used to validate and enrich findings. Thematic coding identified the primary causes of downtime, and Value Stream Mapping (VSM) quantified the impact of changeover activities. Results: Analysis revealed five principal themes contributing to low utilization: changeover times; idle booked time; organizational factors; decision‐making delays; and unplanned stops. Among these, changeover activities emerged as the most critical internal driver of downtime. Based on these insights, three targeted improvements were suggested: redesign of fixtures to simplify the change of test objects, trackwidth adapter for the adjustment of the dynamometer width, and implementation of an operator certification. VSM demonstrated that these measures could reduce changeover duration by more than 70%, translating into substantial gains in overall test‐bench uptime. Conclusions: By first diagnosing root causes of downtime and then applying SMED to streamline internal and external changeover activities, this method delivers rapid uptime improvements and establishes an adaptable framework for boosting efficiency in similar R&D test environments.