LSCM re-aiming feature for detection of single-photon sources in hBN

Defects in hexagonal boron nitride (hBN) are emerging as an important source of single-photon emitters which are crucial for quantum technologies like quantum communication. Critical to such applications is the understanding of the physics of the quantum emitters in hBN. To research these emitters the Quantum Nano Photonics group at KTH probe defects using laser photoluminescence in a laser scanning confocal microscope. In this report we improve on the microscope by implementing functionalities re-aiming the microscope during long measurements of the defects and thus counteracting drift. The photoluminescence map around the emitter was analyzed using three different methods, to find the best spot to re-aim the microscope. We discuss these methods and conclude that the most suitable method for our need is regularly taking a photoluminescence map around the emitter and re-aiming it to the brightest spot after passing the map through a Gaussian filter. We also report on characteristics of single-photon emitters found with the microscope.

Publication Details

Journal
KTH Publication Database DiVA (KTH Royal Institute of Technology)
Published
2025-01-01
Primary Topic
Diamond and Carbon-based Materials Research
Type
article
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article

LSCM re-aiming feature for detection of single-photon sources in hBN

KTH Publication Database DiVA (KTH Royal Institute of Technology)
Diamond and Carbon-based Materials Research
article

LSCM re-aiming feature for detection of single-photon sources in hBN

article en

Abstract

Defects in hexagonal boron nitride (hBN) are emerging as an important source of single-photon emitters which are crucial for quantum technologies like quantum communication. Critical to such applications is the understanding of the physics of the quantum emitters in hBN. To research these emitters the Quantum Nano Photonics group at KTH probe defects using laser photoluminescence in a laser scanning confocal microscope. In this report we improve on the microscope by implementing functionalities re-aiming the microscope during long measurements of the defects and thus counteracting drift. The photoluminescence map around the emitter was analyzed using three different methods, to find the best spot to re-aim the microscope. We discuss these methods and conclude that the most suitable method for our need is regularly taking a photoluminescence map around the emitter and re-aiming it to the brightest spot after passing the map through a Gaussian filter. We also report on characteristics of single-photon emitters found with the microscope.

KTH Publication Database DiVA (KTH Royal Institute of Technology)
Openalex Percentile: Top 59%
Diamond and Carbon-based Materials Research
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LSCM re-aiming feature for detection of single-photon sources in hBN · KTH Publication Database DiVA (KTH Royal Institute of Technology) (2025) | TGRS Research Map | TGRS