Thickness-dependent intergrowth of Ruddlesden–Popper impurity structures in solid-phase epitaxial growth of Ca2RuO4 thin films
Thickness-dependent intergrowth of Ruddlesden–Popper impurity structures in solid-phase epitaxial growth of Ca2RuO4 thin films, Thickness-dependent intergrowth of Ruddlesden–Popper impurity structures in solid-phase epitaxial growth of Ca2RuO4 thin films
Publication Details
- Journal
- Tokyo Tech Research Repository (Tokyo Institute of Technology)
- Published
- 2024-10-26
- Primary Topic
- Advanced Condensed Matter Physics
- Type
- article
- Field-Weighted Citation Impact
- 0.00