Characterization and performance evaluation of ferroelectric films

Ferroelectric materials have polarization and piezoelectric properties that make them useful for RF circuits. This project focuses on characterizing ferroelectric films using UVM's new Keithley 4200A semiconductor parameter analyzer. The pulse measure unit is used to perform hysteresis measurements on various films to extract capacitive, ferroelectric, and resistive leakage currents, verifying hardware performance for use in future sample characterization and optimization. By using this tool, we hope to get a better understanding of ferroelectric materials such as In2Se3 and how they can be used in RF components, like reprogrammable devices.