Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques
Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques, Atomic Scale and Electronic Structure Characterization of Amorphous Tantalum Oxide Thin Films via Synchrotron X-ray Techniques
Publication Details
- Journal
- Tokyo Tech Research Repository (Tokyo Institute of Technology)
- Published
- 2024-10-26
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00