Dephasing mechanisms of topologically protected 2D surface carriers in sputtered SnTe thin films
This data set contains raw and processed data used for th publication titled "Dephasing mechanisms of topologically protected 2D surface carriers in sputtered SnTe thin films". It includes magnetotransport measurements as well as AFm, XRD, and XPS data.
Publication Details
- Journal
- Zenodo (CERN European Organization for Nuclear Research)
- Published
- 2025-05-26
- DOI
- https://doi.org/10.5281/zenodo.15516998
- Primary Topic
- Topological Materials and Phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.00