D5.1. – Electrical characterization of LPE derived novel materials

Prior to evaluation of excellent electronic properties of macroscale printed devices, individual nanosheets must be assessed first because it tends to be limited by quality of the inter-nanosheet junctions. Therefore, it is necessary to configure electrical measurement for fundamental characterization. Herein, we produce individual nanosheet field-effect transistors in 5-terminal contact electrodes after a nanosheet transfer onto high-k dielectric substrates from various EE-TMD or LPE-TMD dispersions. A process for the consecutive EBL has been developed. We defined multiple contact electrodes on individual TMD nanosheets on a range of various materials. That way, it was possible to perform 4-point probe measurements allowing precise determination of the conductance of individual nanosheet while removing parasitic components or minimizing their contribution at the contact interfaces. Particularly in the case of EE-PtSe2 nanosheets, this type of measurements has been carried out for the first time. This type of assessment of novel TMD materials will eventually suggest an index indicating the maximum achievable mobility for subsequent printed devices, therefore it will be also compared with and benchmarked against theoretical prediction and THz time domain spectroscopy results. Not only for single nanosheets, but the same measurement scheme will be applied to networks, film, and multicomponent heterostructures.