X-ray induced grain boundary formation and grain rotation in Bi$_2$Se$_3$

Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi$_2$Se$_3$) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X-ray radiation can rapidly change size and texture of grains.

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Publication Details

Journal
DESY Publication Database (PUBDB) (Deutsches Elektronen-Synchrotron)
Published
2025-01-01
DOI
https://doi.org/10.3204/pubdb-2024-06396
Primary Topic
Advanced Materials Characterization Techniques
Type
article
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article

X-ray induced grain boundary formation and grain rotation in Bi$_2$Se$_3$

DESY Publication Database (PUBDB) (Deutsches Elektronen-Synchrotron)
Advanced Materials Characterization Techniques
article

X-ray induced grain boundary formation and grain rotation in Bi$_2$Se$_3$

article en

Abstract

Optimizing grain boundary characteristics in polycrystalline materials can improve their properties. Many processing methods have been developed for grain boundary manipulation, including the use of intense radiation in certain applications. In this work, we used X-ray free electron laser pulses to irradiate single-crystalline bismuth selenide (Bi$_2$Se$_3$) and observed grain boundary formation and subsequent grain rotation in response to the X-ray radiation. Our observations with simultaneous transmission X-ray microscopy and X-ray diffraction demonstrate how intense X-ray radiation can rapidly change size and texture of grains.

DESY Publication Database (PUBDB) (Deutsches Elektronen-Synchrotron)
Deutsches Elektronen-Synchrotron DESY (DE), European X-Ray Free-Electron Laser (DE)
Openalex Percentile: Top 54%
Advanced Materials Characterization Techniques
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