Investigation on THz response of dielectric substrates for integration and packaging of direct THz detectors

Within this work, we investigated the response of dielectric materials used in high-frequency laminates, such as Rogers laminates and quartz substrates. A free-space, frequency-domain, non-destructive technique using a continuous-wave THz source was employed in these experiments to provide insights into the material parameters from the experimental results with a focus on the losses induced by these materials in the THz domain (0.02 to 2.5 THz). We extracted the material parameters from the experimental results. The results on the broadband response of materials provide valuable insights for designing novel frequency-selective passive components, which can be used for packaging and integration of THz detectors.