ATTRIBUTE CONTROL CHART APPROACH FOR LIFE TESTING USING EXPONENTIAL-POISSON DISTRIBUTION

Manufacturing processes are often monitored using control charts, visual representations of collected data. These charts help determine if a production process is stable. Various control chart methods have been developed to address diverse production scenarios. For some products, lifetime is a crucial quality attribute. Life testing, while valuable for evaluating production processes and classifying products as conforming or non-conforming, can be time-consuming. Consequently, censoring techniques are indispensable in such situations. Life testing often employs censoring methods like Type I, Type II, and Hybrid censoring. Compounding techniques create new distributions, expanding existing mixture models. These compound distributions are crucial in life testing, especially when dealing with processes exhibiting significant early failures. This article introduces a novel attribute np control chart for monitoring the median lifetime of products under a hybrid censoring plan, assuming an Exponential-Poisson lifetime distribution. Optimal control chart parameters are derived to minimize deviations from a target Average Run Length (ARL) for an in-control process. The chart’s parameters are calculated for different scenarios, and its performance is evaluated using ARL analysis. Numerical examples and simulated data illustrate the chart’s practical application and demonstrate its utility.