Flash FPGA driver test technology based on chiplets

For the coverage testing of Flash FPGA drivers based on chiplets, the system control registers and boundary scan register modules of Flash FPGA were utilized to configure different driving modes of the FPGA, which were then compared and validated against the traditional configuration of single-chip Flash units. The experimental results show that the driving performance configured by the control registers of Flash FPGA based on chiplets is consistent with that of the traditional single-chip Flash unit configuration, with the testing time reduced by three times.

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Publication Details

Journal
SHILAP Revista de lepidopterología
Published
2025-05-01
DOI
https://doi.org/10.16157/j.issn.0258-7998.246047
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

Flash FPGA driver test technology based on chiplets

SHILAP Revista de lepidopterología
VLSI and Analog Circuit Testing
article

Flash FPGA driver test technology based on chiplets

article en

Abstract

For the coverage testing of Flash FPGA drivers based on chiplets, the system control registers and boundary scan register modules of Flash FPGA were utilized to configure different driving modes of the FPGA, which were then compared and validated against the traditional configuration of single-chip Flash units. The experimental results show that the driving performance configured by the control registers of Flash FPGA based on chiplets is consistent with that of the traditional single-chip Flash unit configuration, with the testing time reduced by three times.

SHILAP Revista de lepidopterología
ETC International (NL)
Affordable and clean energy
Openalex Percentile: Top 47%
VLSI and Analog Circuit Testing
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Flash FPGA driver test technology based on chiplets · SHILAP Revista de lepidopterología (2025) | TGRS Research Map | TGRS