Twyman effect in laser polishing of fused silica wafers
\nThis paper investigates the challenges of minimizing wafer deformation during laser polishing of fused silica. The focus is on the Twyman effect, which causes unwanted curvature in thin plates. Strategies to reduce stress-induced deformation are proposed to enhance the reproducibility of the laser polishing process.\n
Publication Details
- Journal
- Springer Link (Chiba Institute of Technology)
- Published
- 2024-10-31
- DOI
- https://doi.org/10.1051/epjconf/202430903026/pdf
- Primary Topic
- Genetic diversity and population structure
- Type
- article
- Field-Weighted Citation Impact
- 0.00