Large self-heating by trapped-flux reduction in Sn-Pb solders

\n\nMagnetic flux trapping in field-cooled (FC) Sn-Pb solders has been recently studied because of the observation of nonvolatile magneto-thermal switching (<sc>Arima</sc> H. et al., Commun. Mater., 5 (2024) 34) and anomalous magnetic field-temperature (H-T) phase diagrams (<sc>Murakami</sc> T. et al., AIP Adv., 13 (2023) 125008). In this paper, we investigate the origin of the anomalously low specific heat (C) in Sn10-Pb90 and Sn45-Pb55 solders after FC at H = 1500 Oe. We show that the FC solders exhibit self-heating possibly caused by the flux flow during the reduction of trapped fluxes when heating the sample during the C measurements. The T dependence of T rise clearly exhibits unexpectedly large values when the low-C states are observed. In addition, the cause of the transition-like behavior in C-T of FC solders is explained by local heating during H control and flux-jump phenomena.\n

Publication Details

Journal
Springer Link (Chiba Institute of Technology)
Published
2024-08-21
DOI
https://doi.org/10.1209/0295-5075/ad6802/pdf
Primary Topic
Glass properties and applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Large self-heating by trapped-flux reduction in Sn-Pb solders

Springer Link (Chiba Institute of Technology)
Glass properties and applications
article

Large self-heating by trapped-flux reduction in Sn-Pb solders

article en

Abstract

\n\nMagnetic flux trapping in field-cooled (FC) Sn-Pb solders has been recently studied because of the observation of nonvolatile magneto-thermal switching (<sc>Arima</sc> H. et al., Commun. Mater., 5 (2024) 34) and anomalous magnetic field-temperature (H-T) phase diagrams (<sc>Murakami</sc> T. et al., AIP Adv., 13 (2023) 125008). In this paper, we investigate the origin of the anomalously low specific heat (C) in Sn10-Pb90 and Sn45-Pb55 solders after FC at H = 1500 Oe. We show that the FC solders exhibit self-heating possibly caused by the flux flow during the reduction of trapped fluxes when heating the sample during the C measurements. The T dependence of T rise clearly exhibits unexpectedly large values when the low-C states are observed. In addition, the cause of the transition-like behavior in C-T of FC solders is explained by local heating during H control and flux-jump phenomena.\n

Springer Link (Chiba Institute of Technology)
Exploratory Research for Advanced Technology
Openalex Percentile: Top 77%
Glass properties and applications
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