Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR Metrics

Improving the outcomes of very-large-scale integration design without altering the underlying design enablement, such as process, device, interconnect, and IPs, is critical for integrated circuit (IC) designers. Parameter tuning for electronic design automation (EDA) tools is an emerging technology for improving the final design Quality-of-Result (QoR). It can be observed that many complex heuristics have been accreted upon previous complex heuristics integrated into tools, resulting in a vast number of tunable parameters. Even worse, these parameters include both continuous and discrete ones, making the parameter tuning process laborious and challenging. In this paper, we propose an attention-based EDA tool parameter explorer. A self-attention mechanism is developed to navigate the parameter importance. A hybrid space Gaussian process model is leveraged to optimize continuous and discrete parameters jointly, capturing their complex interactions. Considering multiple QoR metrics and the large amount of time required to invoke EDA tools, a customized acquisition function based on expected hypervolume improvement (EHVI) is proposed to enable multi-objective optimization and parallel evaluation. In addition, a self-adjusting additive kernel is proposed to optimize the hybrid space Bayesian Optimization flow and increase its explainability. Experimental results on a set of IWLS2005 benchmarks demonstrate the effectiveness and efficiency of our method.

Institutions

Publication Details

Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Published
2025-07-18
DOI
https://doi.org/10.1109/tcad.2025.3590661
Primary Topic
Soybean genetics and cultivation
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR Metrics

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Soybean genetics and cultivation
article

Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR Metrics

article en

Abstract

Improving the outcomes of very-large-scale integration design without altering the underlying design enablement, such as process, device, interconnect, and IPs, is critical for integrated circuit (IC) designers. Parameter tuning for electronic design automation (EDA) tools is an emerging technology for improving the final design Quality-of-Result (QoR). It can be observed that many complex heuristics have been accreted upon previous complex heuristics integrated into tools, resulting in a vast number of tunable parameters. Even worse, these parameters include both continuous and discrete ones, making the parameter tuning process laborious and challenging. In this paper, we propose an attention-based EDA tool parameter explorer. A self-attention mechanism is developed to navigate the parameter importance. A hybrid space Gaussian process model is leveraged to optimize continuous and discrete parameters jointly, capturing their complex interactions. Considering multiple QoR metrics and the large amount of time required to invoke EDA tools, a customized acquisition function based on expected hypervolume improvement (EHVI) is proposed to enable multi-objective optimization and parallel evaluation. In addition, a self-adjusting additive kernel is proposed to optimize the hybrid space Bayesian Optimization flow and increase its explainability. Experimental results on a set of IWLS2005 benchmarks demonstrate the effectiveness and efficiency of our method.

IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsVol. 45(2)
University of Science and Technology of China (CN), Chinese University of Hong Kong (HK), ShanghaiTech University (CN), Cloud Computing Center (CN), Zhejiang University (CN)
Openalex Percentile: Top 40%
Soybean genetics and cultivation
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Attention-Based EDA Tool Parameter Explorer: From Hybrid Parameters to Multi-QoR Metrics · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (2025) | TGRS Research Map | TGRS