Imperfect interfaces characterization in a multilayered structure by means of an equivalent dynamic model

The research presented in this paper aims to demonstrate how imperfect interfaces influence the behavior of a multilayered structure. To achieve this, a dynamic equivalent model for multilayered panels is used, enabling the characterization of these interfaces using experimental data. This model, known as the Layer Wise (LW) model, incorporates imperfections in the interfaces through sliding displacement. To effectively validate the model against experimental measurements, an equivalence with a thin beam is established. Then the experimental methodology used for characterization is outlined, including the setup, considered samples, and data processing techniques. Specifically, the Corrected Force Analysis Technique (CFAT) is used, which is a robust method based on the equations of motion for thin plates or beams. This method, for the first time, allows obtaining broadband frequency results, facilitating dynamic monitoring of interface states in multilayers. The concurrently developed model enables the quantification of an interface parameter through experimental measurements. Finally, a detailed analysis of the results obtained through this methodology is provided, emphasizing the significant influence of imperfect interfaces on the dynamics of multilayered structures.