Active Autofocusing Method With Plane Tilt Correction for AR Microdisplay Inspection

An active autofocusing technology with plane tilt correction is proposed for the first time for use in display application scenarios. This technology is based on the variance of the Laplacian operator and machine vision principles. A deep learning-based multilayer perceptual classification neural network is proposed to quickly determine the tilt state of the plane and facilitate device-camera alignment. In testing, the neural network achieved 99.3% accuracy. The technology has demonstrated feasibility for leveling and focusing in commercial microdisplays for augmented reality (AR) applications within the micrometer-scale focus range through experimental validation. Our proposed autofocusing method is suitable for industrial inspection and offers the advantages of a lower risk of sample damage caused by auxiliary components and easy integration.

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Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3553246
Primary Topic
Agricultural pest management studies
Type
article
Field-Weighted Citation Impact
0.00
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article

Active Autofocusing Method With Plane Tilt Correction for AR Microdisplay Inspection

IEEE Transactions on Instrumentation and Measurement
Agricultural pest management studies
article

Active Autofocusing Method With Plane Tilt Correction for AR Microdisplay Inspection

article en

Abstract

An active autofocusing technology with plane tilt correction is proposed for the first time for use in display application scenarios. This technology is based on the variance of the Laplacian operator and machine vision principles. A deep learning-based multilayer perceptual classification neural network is proposed to quickly determine the tilt state of the plane and facilitate device-camera alignment. In testing, the neural network achieved 99.3% accuracy. The technology has demonstrated feasibility for leveling and focusing in commercial microdisplays for augmented reality (AR) applications within the micrometer-scale focus range through experimental validation. Our proposed autofocusing method is suitable for industrial inspection and offers the advantages of a lower risk of sample damage caused by auxiliary components and easy integration.

IEEE Transactions on Instrumentation and MeasurementVol. 74
Xiamen University (CN)
Affordable and clean energy
Openalex Percentile: Top 42%
Agricultural pest management studies
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