Data-driven Synchrotron X-ray Microscopy Characterization of Functional Thin Films

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Publication Details

Journal
eCommons (Cornell University)
Published
2025-06-30
DOI
https://doi.org/10.7298/72rj-4719
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
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article

Data-driven Synchrotron X-ray Microscopy Characterization of Functional Thin Films

eCommons (Cornell University)
Electron and X-Ray Spectroscopy Techniques
article

Data-driven Synchrotron X-ray Microscopy Characterization of Functional Thin Films

article en

Abstract

No abstract available for this paper.
eCommons (Cornell University)
Cornell University (US)
Openalex Percentile: Top 54%
Electron and X-Ray Spectroscopy Techniques
DOIOpen Access PDFOpenAlex
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Data-driven Synchrotron X-ray Microscopy Characterization of Functional Thin Films · eCommons (Cornell University) (2025) | TGRS Research Map | TGRS