Supplementary document for Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing - 7458702.pdf

Publication Details

Journal
Figshare
Published
2025-01-01
DOI
https://doi.org/10.6084/m9.figshare.28890671
Primary Topic
Advancements in Photolithography Techniques
Type
article
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Supplementary document for Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing - 7458702.pdf

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Advancements in Photolithography Techniques
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Supplementary document for Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing - 7458702.pdf

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Supplementary document for Wafer-scale waveguide sidewall roughness scattering loss characterization by image processing - 7458702.pdf · Figshare (2025) | TGRS Research Map | TGRS