ON THE ELECTROLUMINESCENCE, OPTICAL AND ELECTRICAL PROPERTIES OF TIO2/NIO CORE-SHELL THIN FILMS

The electroluminescent properties, some optical and electrical properties of nanocrystalline TiO2/NiO core-shell thin films were studied and reported in this paper. The study was within the ultraviolet, visible and near infrared regions of electromagnetic spectrum. The films’ structural properties, microstructure, optical and electrical properties were analysed using X-ray diffraction, scanning electron microscope [SEM] analysis, spectrophotometric analysis and the four-point probe. In this paper, the dependence of reflectance, extinction coefficients and resistivity of the thin film samples on the annealing temperatures were particularly highlighted. Increasing the annealing temperatures from 373K to 673K resulted in the decrease in resistivity from 1.683 x 104Ωm to 1.121 x 104Ωm. The films have low reflectance values ranging from 10% to 20%, and the increase in the annealing temperatures increased and enhanced the electroluminescent property of the studied core-shell thin films

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Publication Details

Journal
Afrischolar Discovery
Published
2025-07-15
DOI
https://doi.org/10.60787/jnamp.vol69no2.527
Primary Topic
Transition Metal Oxide Nanomaterials
Type
article
Field-Weighted Citation Impact
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article

ON THE ELECTROLUMINESCENCE, OPTICAL AND ELECTRICAL PROPERTIES OF TIO2/NIO CORE-SHELL THIN FILMS

Afrischolar Discovery
Transition Metal Oxide Nanomaterials
article

ON THE ELECTROLUMINESCENCE, OPTICAL AND ELECTRICAL PROPERTIES OF TIO2/NIO CORE-SHELL THIN FILMS

article en

Abstract

The electroluminescent properties, some optical and electrical properties of nanocrystalline TiO2/NiO core-shell thin films were studied and reported in this paper. The study was within the ultraviolet, visible and near infrared regions of electromagnetic spectrum. The films’ structural properties, microstructure, optical and electrical properties were analysed using X-ray diffraction, scanning electron microscope [SEM] analysis, spectrophotometric analysis and the four-point probe. In this paper, the dependence of reflectance, extinction coefficients and resistivity of the thin film samples on the annealing temperatures were particularly highlighted. Increasing the annealing temperatures from 373K to 673K resulted in the decrease in resistivity from 1.683 x 104Ωm to 1.121 x 104Ωm. The films have low reflectance values ranging from 10% to 20%, and the increase in the annealing temperatures increased and enhanced the electroluminescent property of the studied core-shell thin films

Afrischolar Discovery
Funai Electric (Japan) (JP), Ebonyi State University (NG)
Openalex Percentile: Top 59%
Transition Metal Oxide Nanomaterials
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