Compton profile of Ta for 59.54 keV gamma radiation source for industrial applications

Abstract- The Compton profile of Tantalum has been determined from the measured differential cross sections at 165°using a high resolution hyper pure germanium detector for 59.54 keV gamma rays from 241Am source. A 99.9% purethin Ta foil was used in measuring the scattering cross sections. A personal computer based 8K-multi-channel analyzerwas used to record the data. The Compton profiles were calculated using these experimental data by employing thetechniques of Eisenberger and Reed as well as Ribberfors. The results were found to agree with the theoretical values ofBiggs et al and Fernandez within the range of experimental errors. Understanding the Compton profile throughCompton scattering can be used in industry to optimize the performance of tantalum-based capacitors and otherelectronic components. The knowledge gained from Compton profile studies can also be applied to optimize industrialprocesses involving tantalum, such as metal fabrication, coating, and processing.