What's New in Keysight Device Modeling 2025
Challenges in Device Modeling • Model extraction is increasingly time-consuming • Smaller process nodes • High-volume measurement data • Higher frequency/power • New materials • In-house Solutions • Limited features and scalability • Manual measurement and data processing • Tedious maintenance
Institutions
- Keysight Technologies (United States) (US)
- Keysight Technologies (United Kingdom) (GB)
Publication Details
- Journal
- Zenodo (CERN European Organization for Nuclear Research)
- Published
- 2024-12-11
- DOI
- https://doi.org/10.5281/zenodo.14621745
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00