Fuzzing the ARM Cortex-M: A Survey
Security testing low-level connected devices such as Internet ofThings (IoT) devices is difficult due to their limited memory, communicationbandwidth, and processing power. As a result, traditional testing processesbecome difficult and time-consuming in such cases. In this paper, we surveyrecent fuzzers suitable for fuzzing devices with the most common type ofmicroprocessor: the ARM Cortex-M.
Institutions
- SINTEF (NO)
- Norwegian University of Science and Technology (NO)
Publication Details
- Journal
- Zenodo (CERN European Organization for Nuclear Research)
- Published
- 2024-10-01
- DOI
- https://doi.org/10.5281/zenodo.13869125
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00