Er3+ doped amorphous tellurite thin films

Accepted manuscript of a paper to be published in JACerS journal. Abstract: Radio Frequency (RF) magnetron sputtering was used to deposit amorphous tellurite thin films from glassy targets from TeO2–ZnO–Na2O/BaO/Bi2O3 system doped with 2.5 mol% of Er2O3. The impact of the sputtering power on the optical, luminescence and structural properties of the films is discussed. The deposition process leads to amorphous and transparent films which emit light in the visible and NIR confirming the presence of Er3+ in the films’ network. Owing to their large refractive index and stability overtime, the Bi containing films are potential materials for integrated photonics and optical switches.