LATE LEAD FAILURE IN CARDIAC IMPLANTABLE ELECTRONIC DEVICES: "CATASTROPHIC IF MISSED"

ABSTRACT Late lead failure in cardiac implantable electronic devices (CIED) pose a significant clinical challenge and has life threatening consequences. The etiology is multifaceted and can be due to patient specific factors, external mechanical stress or lead characteristics. Diagnosing a lead failure typically involves device interrogation, electrogram monitoring and imaging studies. Treatment often requires either lead revision or replacement. Lead related reintervention is the most common complication after CIED implantation and carries a higher risk of infection. Proactive monitoring is essential to ensure patient safety. We have discussed two cases of late lead failure which were diagnosed and managed by lead revision without extraction.