Physical design of an online beam monitor for heavy-ion single event effects

Accurate measurement of flux rate is essential in heavy-ion single event effects tests, but it presents significant challenges for monitoring low energy (5~10 MeV/u) and low intensity (less than 1E6 /s) heavy-ion beams. In this paper, we propose a novel detector that enables real-time monitoring of flux rate by simultaneously measuring the beam intensity and profile using secondary electrons on both the front and back surfaces of thin foils. The confinement of sec-ondary electrons through electric and magnetic fields is achieved, with CST simulation has been utilized to validate the method. This approach offers several ad-vantages over conventional methods, including high space and time resolution, reduced mass thickness, and multi-parameter measurement capability.

Publication Details

Journal
JACOW
Published
2024-12-18
DOI
https://doi.org/10.18429/jacow-ibic2024-wep17
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
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article

Physical design of an online beam monitor for heavy-ion single event effects

JACOW
Radiation Effects in Electronics
article

Physical design of an online beam monitor for heavy-ion single event effects

article en

Abstract

Accurate measurement of flux rate is essential in heavy-ion single event effects tests, but it presents significant challenges for monitoring low energy (5~10 MeV/u) and low intensity (less than 1E6 /s) heavy-ion beams. In this paper, we propose a novel detector that enables real-time monitoring of flux rate by simultaneously measuring the beam intensity and profile using secondary electrons on both the front and back surfaces of thin foils. The confinement of sec-ondary electrons through electric and magnetic fields is achieved, with CST simulation has been utilized to validate the method. This approach offers several ad-vantages over conventional methods, including high space and time resolution, reduced mass thickness, and multi-parameter measurement capability.

JACOW
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Radiation Effects in Electronics
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