Measurement of dielectric material properties application note.

<p>This document (application note) provides details on measuring the dielectric properties of materials using a network analyzer. It outlines methods for converting s-parameters obtained from the network analyzer measurements into usable dielectric properties, such as the permittivity of FR4. This application note served as a reference for the methods employed in our research to determine the dielectric constant of FR4 material.</p> <p>(PDF)</p>