Silicon MicroringResonator Integrated Hafnium ZirconiumOxide Ferrophotonic Non-Volatile Memory

We experimentally demonstrate the heterogeneous integration of ferroelectric hafnium zirconium oxide (HZO) with a silicon photonic microring resonator and demonstrate two non-volatile states for data storage by switching the polarization of HZO. Capped by transparent conducting titanium doped indium oxide (ITiO), the device functions as a metal insulator semiconductor (MIS) capacitor and utilizes the refractive index modulation via carrier (hole) accumulation and the effect of trapped charges at the ferroelectric–silicon interface to create the non-volatile binary switching states. In contrast to electronic devices where trapped charges at the silicon–ferroelectric interface reduce the memory window, in our ferrophotonic device, trapped charges amplify the refractive index difference in the binary states due to effective screening of the silicon in inversion. By switching the applied bias from negative to positive, the optical power transmitted through the ring switches with 3.5 dB output power difference between the non-volatile set and reset states and 40 pJ switching energy at ±8 V. Preliminary results suggest a path toward achieving sub-1 V non-volatile ferrophotonic switching.