Robust dark-field signal extraction for modulation-based x-ray tensor tomography

We demonstrate a robust signal extraction method for x-ray speckle-based tensor tomography. We validate the effectiveness of the method for several carbon fiber composites, highlighting its potential for industrial applications. The proposed method can be adapted to various acquisition schemes and wavefront-marking optical elements, making it a versatile and robust tool for x-ray scattering tensor tomography.

Publication Details

Journal
Repository for Publications and Research Data (ETH Zurich)
Published
2024-12-23
DOI
https://doi.org/10.3929/ethz-b-000713401
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
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article

Robust dark-field signal extraction for modulation-based x-ray tensor tomography

Repository for Publications and Research Data (ETH Zurich)
Advanced X-ray Imaging Techniques
article

Robust dark-field signal extraction for modulation-based x-ray tensor tomography

article en

Abstract

We demonstrate a robust signal extraction method for x-ray speckle-based tensor tomography. We validate the effectiveness of the method for several carbon fiber composites, highlighting its potential for industrial applications. The proposed method can be adapted to various acquisition schemes and wavefront-marking optical elements, making it a versatile and robust tool for x-ray scattering tensor tomography.

Repository for Publications and Research Data (ETH Zurich)
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Advanced X-ray Imaging Techniques
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Robust dark-field signal extraction for modulation-based x-ray tensor tomography · Repository for Publications and Research Data (ETH Zurich) (2024) | TGRS Research Map | TGRS