Novel Control Methodologies of Back-to-Back B6 Bridges for an Application-Related Stress Test Setup

Back-to-back (B2B) B6 bridges stand out as the go-to solution for power cycling and application related stress tests in the reliability sector of power electronics. This paper delves into novel control strategies for the electro-thermal stress reconstruction of Device-under-Tests (DUTs), with a specific focus on signal shape reconstruction and current ripple reduction. A novel precalculation method is introduced, enabling the prediction of an operating point for open-loop control, thus facilitating the reconstruction of complex signal shapes. The presented concepts are rigorously evaluated through hardware testing and real measurement results, underlining their practical viability in real-world applications.