Bunch-by-bunch profile measurement during beam available time

This paper presents a bunch-by-bunch profile measurement system, which includes an optical imaging frontend, a multi-channel photomultiplier tube (MAPMT) for photoelectric conversion, and a high-sampling-rate oscilloscope for data recording. The system is capable of measuring the transverse positions and sizes of each bunch in the storage ring during the beam availability period of the Hefei Light Source II (HLS-II). By finely processing the collected data, the system can effectively recognize the dynamic characteristics of the beams and monitor the performance of the light source. Here, the paper elaborates on the system’s design principles, optical layout and system configuration. It also introduces the program workflow of data processing, along with an analysis of the corresponding measurement errors.