Chemical Mappingof Supramolecular Self-AssembledMonolayers via Atomic Force Microscopy-Based Infrared with a Nanometer-ScaleLateral Resolution
Atomic force microscopy-based infrared (AFM-IR) techniques have long enabled chemical imaging of surfaces with spatial resolutions down to 10 nm. In this study, we push the boundaries of AFM-IR spatial resolution to the single-nanometer scale, achieving chemical mapping of supramolecular networks at the submolecular level. This breakthrough is made possible by implementing an innovative tapping-mode AFM-IR approach. Such unprecedented resolution opens new horizons for advancements in nanoscience.
Publication Details
- Journal
- Figshare
- Published
- 2025-03-28
- DOI
- https://doi.org/10.1021/acs.jpclett.5c00360.s001
- Primary Topic
- Force Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00