Determination\nof Rare Earth Elements in Cosmo-geological\nSamples Aided by Wavelength Dispersive X‑ray Fluorescence Spectroscopy

While rare earth elements are generally probed with destructive\ntechniques such as LA-ICP-MS, this causes at least partial destruction\nof the sample, which is not desirable when precious materials such\nas cosmo-geological (return) samples are examined. With the proposed\nwavelength dispersive synchrotron radiation X-ray fluorescence spectroscopy\ntechnique the rare earth element characteristic L-lines, situated\nbetween 4.65 and 7.66 keV, can be qualitatively and quantitatively\ndetected in a nondestructive manner in precious samples. The method\nis based on a sequential scanning θ-2θ geometrical setup\nmaking use of a flat Ge(111) analyzer crystal and a small energy dispersive\ndetector, measuring the radiation in Bragg conditions. To optimize\nthe solid angle of detection a polycapillary half-focusing lens was\npositioned between the sample and the crystal, collimating and guiding\nthe radiation. Validation of the technique is provided by comparing\nthe obtained quantitative results with previously obtained LA-ICP-MS\nresults measured on the sample.