Nonvolatileand Volatile Memory Fusion of Antiferroelectric-likeHafnium–Zirconium Oxide for Multi-Bit Access and Endurance>10<sup>12</sup> Cycles by Alternating Polarity Cycling RecoveryandSpatially Resolved Evolution

The fusion of volatile and nonvolatile memory within a complementary-dynamic random-access memory (C-DRAM) in one cell is proposed with antiferroelectric-like hafnium–zirconium oxide with dual function characteristics of DRAM and storage class memory in the memory hierarchy. Atomic-resolution spherical aberration-corrected scanning transmission electron microscopy is employed to directly reveal the insights of phase evolution by utilizing diffractograms to determine lattice parameters. Storage-data-transfer-cycling-recovery with an alternating access scheme is introduced due to the characteristic of independent domains to exhibit multilevel states. Remanent polarization (<i>P</i><sub>r</sub>) can be restored, and 34 periods (3 × 10<sup>10</sup> cycles/period) to accumulate 1.02 × 10<sup>12</sup> switching cycles are demonstrated. The proposed method is effective in prolonging the endurance and evaluating the spatially resolved evolution of polarization.

Publication Details

Journal
Figshare
Published
2025-02-20
DOI
https://doi.org/10.1021/acsami.4c14132.s001
Primary Topic
Ferroelectric and Negative Capacitance Devices
Type
article
Field-Weighted Citation Impact
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Nonvolatileand Volatile Memory Fusion of Antiferroelectric-likeHafnium–Zirconium Oxide for Multi-Bit Access and Endurance>1012 Cycles by Alternating Polarity Cycling RecoveryandSpatially Resolved Evolution

Figshare
Ferroelectric and Negative Capacitance Devices
article

Nonvolatileand Volatile Memory Fusion of Antiferroelectric-likeHafnium–Zirconium Oxide for Multi-Bit Access and Endurance>1012 Cycles by Alternating Polarity Cycling RecoveryandSpatially Resolved Evolution

article en

Abstract

The fusion of volatile and nonvolatile memory within a complementary-dynamic random-access memory (C-DRAM) in one cell is proposed with antiferroelectric-like hafnium–zirconium oxide with dual function characteristics of DRAM and storage class memory in the memory hierarchy. Atomic-resolution spherical aberration-corrected scanning transmission electron microscopy is employed to directly reveal the insights of phase evolution by utilizing diffractograms to determine lattice parameters. Storage-data-transfer-cycling-recovery with an alternating access scheme is introduced due to the characteristic of independent domains to exhibit multilevel states. Remanent polarization (<i>P</i><sub>r</sub>) can be restored, and 34 periods (3 × 10<sup>10</sup> cycles/period) to accumulate 1.02 × 10<sup>12</sup> switching cycles are demonstrated. The proposed method is effective in prolonging the endurance and evaluating the spatially resolved evolution of polarization.

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Ferroelectric and Negative Capacitance Devices
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